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Ohmic Audio

Thiele-Small Parameters And Model Limits

Canonical Definition

Thiele-Small parameters are a lumped small-signal model of an electrodynamic driver near its rest position. The values depend on measurement level, temperature, mounting, fixture resistance, air load, added mass or test-box accuracy, and the model used to fit the impedance and motion data.

They are model inputs, not a one-number enclosure selector and not a complete high-power description.

Measured And Derived Terms

GroupExamplesReporting rule
ElectricalRe, Le and the chosen inductance modelRemove fixture and cable error; state coil temperature.
MechanicalMms, Cms, Rms, Bl, SdState how motion, added mass, or test volume was measured.
DerivedFs, Qes, Qms, Qts, Vas, efficiency or sensitivity estimatesKeep the underlying assumptions and reference conditions attached.

Qts Does Not Choose The Box

Qts describes total damping at the measured small-signal condition. It influences possible alignments, but the final choice also depends on Vas, Fs, Bl, moving mass, excursion and thermal capability, available volume, output target, passband, filters, losses, vent feasibility, vehicle transfer, and acceptable compression.

Two drivers with the same Qts can require very different boxes and can reach very different limits.

Measurement Contract

  1. Record driver identity, orientation, ambient condition, and cool or warmed state.
  2. Record stimulus level, bandwidth, series resistance, cable resistance, and calibration.
  3. State whether parameters came from added mass, test box, laser displacement, or another method.
  4. Report fit quality or repeatability where the instrument provides it.
  5. Repeat after a controlled warm-up when the design is sensitive to parameter shift.

Where The Linear Model Ends

At higher excursion and temperature, Bl, suspension stiffness, inductance, losses, rest position, and voice-coil resistance can change. Thermal compression and nonlinear displacement can dominate even when the low-level model looked ideal. Use large-signal displacement, distortion, compression, and temperature data when the design approaches those limits.

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